Product Description

ASTAR (AUTOMATIC PHASE AND ORIENTATION MAPPING FOR TEM) Orientation Mapping in the TEM. This new system developed by NanoMEGAS allows to scan a region of any TEM sample, record diffraction patterns at high speed, and compare each of them with patterns stored in a dedicated database. This allows to determine the crystalline orientation of the sample at each point, resulting in an orientation mapping, similar to the EBSD mapping done in the SEM, but with a better spatial resolution and directly on the TEM sample. Used conjointly, the precession diffraction allows to highly better the diffraction patterns and to get much more reliable maps in short time. Features of EBSD-SEM Analysers : * ASTAR can easily be retrofitted to any (old or new) 100- 400 kV TEM * TEM based technique similar to EBSD for SEM (with much higher resolution details) * Perform detailed orientation maps (Orientation resolution < 1º, < 5 nm step size) for metals, ceramics , semiconductors and any type of diff